DocumentCode :
1137723
Title :
Encapsulation process development for flexible-circuit based chip scale packages
Author :
Yang, Liyu Steve ; Bernstein, Joseph B.
Author_Institution :
Dept. of Reliability Eng., Univ. of Maryland, College Park, MD, USA
Volume :
25
Issue :
4
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
344
Lastpage :
354
Abstract :
The ultimate driving forces for the development of small form-factor chip scale packages (CSPs) are the market demands for small, light and high performance products. The flex-based μBGA technology has been a very successful package format, and tremendous efforts have been implemented in the process development for the technology. In this article, three flex-based chip scale packages (based on patented μBGA technology) will be discussed. The focus will be on the encapsulation process development. Because of the unique package structures and material sets used in the flex-based CSPs, various encapsulation challenges were raised. The encapsulation solutions are compared and discussed for each type of flex-based μBGA technologies, including the dispensing pump technologies, material characterization, process characterization and optimization. Based on the evaluation results, type C μBGA technology is recommended for its simple assemble process flow, balanced protection on beam leads and solder ball joints and shorter manufacturing cycle time as well.
Keywords :
ball grid arrays; chip scale packaging; circuit optimisation; encapsulation; microassembling; μBGA technology; assemble process flow; beam leads; dispensing pump technologies; encapsulation challenges; encapsulation process development; flexible-circuit based chip scale packages; manufacturing cycle time; market demands; material characterization; material sets; optimization; package structures; process characterization; small form-factor chip scale packages; solder ball joints; Assembly; Chip scale packaging; Curing; Electronics packaging; Encapsulation; Lead; Microassembly; Protection; Space technology; Wafer scale integration;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2002.807730
Filename :
1176918
Link To Document :
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