Title :
Improved calibration and measurement of the scattering parameters of microwave integrated circuits
Author :
Pantoja, Renato R. ; Howes, Michael J. ; Richardson, John R. ; Pollard, Roger D.
Author_Institution :
Dept. of Electr. & Electron. Eng., Leeds Univ., UK
fDate :
11/1/1989 12:00:00 AM
Abstract :
A novel procedure for the calibration of microwave integrated circuit test fixtures, based on a generalization of the through-reflect-line (TRL) algorithm, is presented. Its advantages compared with previous methods, namely bandwidth of validity and standards availability, are discussed. The approach is verified through the characterization of a particular microstrip verification standard using both the generalized TRL and precision 7-mm calibration techniques. Comparison of the results obtained from these schemes indicates that both the effective directivity and the source/load match are better than 30 dB
Keywords :
S-parameters; calibration; integrated circuit testing; measurement errors; measurement standards; microwave integrated circuits; microwave measurement; MIC test fixtures; TRL algorithm generalisation; calibration; effective directivity; microstrip verification standard; microwave integrated circuits; scattering parameters; source/load match; standards availability; through-reflect-line; transmission line length; Bandwidth; Calibration; Circuit testing; Integrated circuit measurements; Integrated circuit modeling; Microwave integrated circuits; Microwave measurements; Scattering parameters; Transmission line matrix methods; Transmission line measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
