Author :
Nayar, Shree K. ; Nakagawa, Yasuo
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
fDate :
8/1/1994 12:00:00 AM
Abstract :
The shape from focus method presented here uses different focus levels to obtain a sequence of object images. The sum-modified-Laplacian (SML) operator is developed to provide local measures of the quality of image focus. The operator is applied to the image sequence to determine a set of focus measures at each image point. A depth estimation algorithm interpolates a small number of focus measure values to obtain accurate depth estimates. A fully automated shape from focus system has been implemented using an optical microscope and tested on a variety of industrial samples. Experimental results are presented that demonstrate the accuracy and robustness of the proposed method. These results suggest shape from focus to be an effective approach for a variety of challenging visual inspection tasks
Keywords :
image sequences; image texture; accuracy; depth estimation algorithm; image focus quality; optical microscope; robustness; shape from focus method; sum-modified-Laplacian operator; visual inspection tasks; Focusing; Image sequences; Layout; Machine vision; Optical imaging; Optical microscopy; Rough surfaces; Shape measurement; Surface roughness; Surface texture;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on