Erasure and Error Decoding for Semiconductor Memories

In this paper we introduce and evaluate error correction methods which takes into account the special properties of failure modes in semiconductor memories. We assume that the memory faults are of the type stuck-to 1 or 0. Thus the fault, once it has occurred, is located to a specific position in a memory word. The position may be found and this fact makes it convenient to use erasure correction, rather than random error correction.