Using suitable approximations, the theory developed in a previous paper (Part I) forms the basis for the digital computer calculations presented in this paper (Part II). These calculations predict 1) the stimulated emission time delay for any value of the injection current amplitude and heat-sink temperature, 2) the temperature and current regions where

switching is possible, and 3) the large differences in delay and

-switching behavior caused by different impurity profiles across the junction due to variations in fabrication. Computer-generated theoretical curves are in good agreement with both the previously known experimental data and the results, to be presented, of new experiments suggested by the theory.