DocumentCode :
1138256
Title :
A practical SPICE model based on the physics and characteristics of realistic single-electron transistors
Author :
Lee, Sang-Hoon ; Kim, Dae Hwan ; Kim, Kyung Rok ; Lee, Jong Duk ; Park, Byung-Gook ; Gu, Young-Jin ; Yang, Gi-Young ; Kong, Jeong-Taek
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Volume :
1
Issue :
4
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
226
Lastpage :
232
Abstract :
A practical model for a single-electron transistor (SET) was developed based on the physical phenomena in realistic Si SETs, and implemented into a conventional circuit simulator. In the proposed model, the SET current calculated by the analytic model is combined with the parasitic MOSFET characteristics, which have been observed in many recently reported SETs formed on Si nanostructures. The SPICE simulation results were compared with the measured characteristics of the Si SETs. In terms of the bias, temperature, and size dependence of the realistic SET characteristics, an extensive comparison leads to good agreement within a reasonable level of accuracy. This result is noticeable in that a single set of model parameters was used, while considering divergent physical phenomena such as the parasitic MOSFET, the Coulomb oscillation phase shift, and the tunneling resistance modulated by the gate bias. When compared to the measured data, the accuracy of the voltage transfer characteristics of a single-electron inverter obtained from the SPICE simulation was within 15%. This new SPICE model can be applied to estimating the realistic performance of a CMOS/SET hybrid circuit or various SET logic architectures.
Keywords :
MOSFET; SPICE; capacitance; circuit simulation; elemental semiconductors; logic gates; silicon; silicon-on-insulator; single electron transistors; tunnelling; Coulomb oscillation phase shift; SET current; SPICE model; Si; bias; circuit simulator; logic architectures; model parameters; parasitic MOSFET characteristics; single-electron transistors; tunneling resistance; voltage transfer characteristics; CMOS logic circuits; Circuit simulation; MOSFET circuits; Nanostructures; Phase modulation; Physics; SPICE; Single electron transistors; Temperature dependence; Tunneling;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2002.807394
Filename :
1176969
Link To Document :
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