Title :
Energy-Recovery Techniques to Reduce On-Chip Power Density in Molecular Nanotechnologies
Author :
Hwang, Myeong-Eun ; Raychowdhury, Arijit ; Roy, Kaushik
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
As scaling of silicon devices continues at an aggressive pace, the problems associated with it are becoming more and more evident. With “short-channel effects” already in the way of scaling, interest has shifted to the possible use of nonsilicon molecular devices for circuit implementation. Carbon nanotube has emerged as a promising candidate. However, molecular devices such as carbon nanotube field-effect transistors (CNFETs) with their super-scaled dimensions and high current densities would increase the power density on chip and reasonable predictions estimate that they would far exceed the maximum power density limitation [1] . This paper explores the use of energy-recovery techniques in molecular CNFET based digital circuits and demonstrates how they can alleviate the power density problem in such circuits.
Keywords :
SPICE; current density; field effect digital integrated circuits; field effect transistors; nanoelectronics; nanotube devices; SPICE; carbon nanotube field-effect transistors; current density; energy-recovery techniques; field effect digital integrated circuits; molecular CNFET based digital circuits; molecular nanotechnologies; nanoelectronics; nanotube devices; on-chip power density reduction; CMOS technology; CNTFETs; Circuits; Cooling; FETs; Inverters; Nanoscale devices; Parasitic capacitance; Silicon; Voltage; Carbon nanotube field-effect transistors (CNFETs);
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.851692