DocumentCode
1138373
Title
Dynamic Testing of Redundant Logic Networks
Author
Si, Siu-chong
Author_Institution
Department of Electrical Engineering, National Taiwan University
Issue
9
fYear
1978
Firstpage
828
Lastpage
832
Abstract
This paper is concerned with the detection of redundant leads in redundant logic networks. The concept of dynamic testing is introduced. We shall show that some traditionally caled undetectable faults may become detectable in dynamic testing, or how to make them become detectable in dynamic testing. Conditions for certain redundancies to be definitely untestable are also discussed.
Keywords
Dynamic testing; SPOOF; fault detection; hazards; logic networks; static testing; transient analysis; transient equations; Circuit faults; Circuit testing; Delay effects; Equations; Fault detection; Hazards; Intelligent networks; Logic testing; Redundancy; Transient analysis; Dynamic testing; SPOOF; fault detection; hazards; logic networks; static testing; transient analysis; transient equations;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1978.1675202
Filename
1675202
Link To Document