Title :
Dynamic Testing of Redundant Logic Networks
Author_Institution :
Department of Electrical Engineering, National Taiwan University
Abstract :
This paper is concerned with the detection of redundant leads in redundant logic networks. The concept of dynamic testing is introduced. We shall show that some traditionally caled undetectable faults may become detectable in dynamic testing, or how to make them become detectable in dynamic testing. Conditions for certain redundancies to be definitely untestable are also discussed.
Keywords :
Dynamic testing; SPOOF; fault detection; hazards; logic networks; static testing; transient analysis; transient equations; Circuit faults; Circuit testing; Delay effects; Equations; Fault detection; Hazards; Intelligent networks; Logic testing; Redundancy; Transient analysis; Dynamic testing; SPOOF; fault detection; hazards; logic networks; static testing; transient analysis; transient equations;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675202
