DocumentCode :
1138414
Title :
Electric field dependence of luminescence due to alpha particles in gaseous xenon and the energy expended per photon
Author :
Saito, Masaki ; Nishikawa, Tsuguo ; Miyajima, Mitsuhiro
Author_Institution :
Graduate Sch. of Eng., Fukui Univ., Japan
Volume :
51
Issue :
5
fYear :
2004
Firstpage :
2125
Lastpage :
2130
Abstract :
The luminescence yield of gaseous xenon by alpha particles is measured as a function of electric field strength under the pressures of 1.0 and 2.0 atm. The luminescence yield rapidly decreases as increase of the electric field and reaches a constant yield at higher electric field strength. The constant luminescence yield suggests an average energy expended per photon (Ws) is determined from its value. In this study, the Ws is obtained to be 59.4±2.4 eV and the ratio of average luminescence yield to average ionization one is calculated to be 0.37±0.02, which agrees well with Platzman´s prediction.
Keywords :
electric fields; gamma-ray detection; gas scintillation detectors; ionisation chambers; luminescence; xenon; 1 atm; 2 atm; Platzman prediction; Xe; alpha particles; average ionization; constant luminescence yield; electric field dependence; electric field strength; energy expended per photon; energy resolution; gaseous xenon; ionization chamber; rare gas; scintillation yield; Alpha particles; Electric variables measurement; Energy measurement; Ionization chambers; Luminescence; Particle measurements; Photodiodes; Photomultipliers; Spontaneous emission; Xenon; Electric field dependence; energy expended per photon; energy resolution; ionization chamber; rare gas; scintillation yield; xenon;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.836030
Filename :
1344295
Link To Document :
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