Title :
A Two-Level Diagnostic Model for Digital Systems
Author :
Mcpherson, John A. ; Kime, Charles R.
Author_Institution :
Department of Electrical and Computer Engineering, University of Wisconsin-Madison
Abstract :
This paper is concerned with the diagnosis of faulty parts in digital systems, including both the detection and location of such parts. The system model presented in this paper considers two levels: the part level at which detectability and diagnosability are defined, and the fault level at which testing is performed and at which functional units or portions thereof are defined. Parameters are defined and used in determining conditions for t-part detectability, t-part diagnosability without repair, and t-part diagnosability with repair. Several examples are presented with the development of the model and derivation of results. These examples illustrate the advantages and limitations of this model.
Keywords :
Diagnosable digital systems; diagnostic modeling; fault-tolerant computing; part diagnosis; Digital systems; Fault detection; Fault diagnosis; Fault location; Fault tolerance; Fault tolerant systems; Large scale integration; Packaging; Performance evaluation; System testing; Diagnosable digital systems; diagnostic modeling; fault-tolerant computing; part diagnosis;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675218