Title :
Charge storage in dielectrics
Author_Institution :
Inst. for Electroacoust., Tech. Univ., Darmstadt, West Germany
fDate :
6/1/1989 12:00:00 AM
Abstract :
Work on charge storage processes in dielectrics performed over the past few years is reviewed. Results obtained on polymers with corona, electron-beam, and pressure-pulse methods and pertaining to trap filling, spatial distribution of the charge, radiation-induced conductivity, and dynamics of the charge decay are discussed. The generation of a variety of polarization distributions in polyvinylidene fluoride with electron-beam and other methods is reviewed. Some results on charge storage and transport in silicon dioxide are described
Keywords :
EBIC; dielectric polarisation; dielectric properties of solids; electrets; polymers; space charge; surface potential; SiO2; charge decay dynamics; charge storage processes; corona; dielectrics; electrets; electron beam method; polarization distributions; polymers; polyvinylidene fluoride; pressure-pulse methods; radiation-induced conductivity; space charge; spatial charge distribution; surface potential; trap filling; Charge measurement; Current measurement; Dielectrics; Electron beams; Polarization; Polymers; Silicon compounds; Surface charging; Surface contamination; Surface discharges;
Journal_Title :
Electrical Insulation, IEEE Transactions on
