DocumentCode
1138696
Title
Dynamics of polarization growth and reversal in PVDF films
Author
Womes, M. ; Bihler, E. ; Eisenmenger, W.
Author_Institution
Phys. Inst., Stuttgart Univ., West Germany
Volume
24
Issue
3
fYear
1989
fDate
6/1/1989 12:00:00 AM
Firstpage
461
Lastpage
468
Abstract
Measurements are presented of the time development of the dielectric displacement and the remanent polarization in polyvinylidene fluoride (PVDF) for poling times ranging from 1 μs to 1000 s and poling fields between 0.8 and 2.0 MV/cm. For longer times (0.1 to 1000 s), the time dependence of the polarization distribution across the film thickness is also determined. After application of a steep rectangular high-voltage pulse, the sample is shorted to zero voltage. The remanent polarization under the short-circuit conditions is compared to the maximum dielectric displacement under the external poling field. A significant time delay of the buildup of the remanent polarization was observed as compared to the dielectric displacement under field. This time delay depends significantly on the applied field strength and the crystallinity of the films. In the case of polarization reversal, a `flipping back´ of the polarization was observed for shorter poling times of up to 200 μs. Under these conditions, a large part of the polarization is reversed under the field, but after the removal of the field, most of the polarization returns to the original direction. The results can be explained by the ferroelectric cooperative coupling of oriented crystallite dipoles to charges trapped at the surface of polarized crystallites
Keywords
dielectric polarisation; ferroelectric materials; piezoelectric materials; polymer films; 1 mus to 1000 s; PVDF films; crystallinity; dielectric displacement; ferroelectric cooperative coupling; oriented crystallite dipoles; piezoelectricity; poling fields; poling times; polyvinylidene fluoride; remanent polarization; short-circuit conditions; steep rectangular high-voltage pulse; time delay; time development; Crystallization; Delay effects; Dielectrics; Displacement measurement; Electric variables measurement; Ferroelectric films; Ferroelectric materials; Piezoelectric polarization; Stability; Switches;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/14.30890
Filename
30890
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