Title :
Middleware and Metrology for the Pervasive Future
Author :
Fillinger, Antoine ; Hamchi, Imad ; Degré, Stéphane ; Diduch, Lukas L. ; Rose, Travis ; Fiscus, Jonathan ; Stanford, Vincent
Author_Institution :
Nat. Inst. of Stand. & Technol., MD, USA
Abstract :
Looks at the data and metrology tools developed by The National Institute of Standards and Technology for the research community, including common middleware for distributed sensor data acquisition and processing.
Keywords :
data acquisition; data flow computing; distributed sensors; middleware; open systems; sensor fusion; ubiquitous computing; NIST data flow system; collaborative development; distributed sensor data acquisition; interoperability; metrology; middleware; pattern recognition; performance measurement; pervasive system; sensor fusion; Data acquisition; Humans; International collaboration; Laboratories; Measurement standards; Metrology; Microphone arrays; Middleware; NIST; Pervasive computing; NDFS-II; NIST Data Flow System; data flow; data transport; interoperability standards; metrology; middleware; multimodal; pervasive computing; sensor networks; user-sensitive interfaces;
Journal_Title :
Pervasive Computing, IEEE
DOI :
10.1109/MPRV.2009.50
