DocumentCode
1138883
Title
Comments on "Multiple Fault Detection in Combinational Network"
Author
Bose, Bella
Author_Institution
Department of Computer Science and Engineering, Southern Methodist University
Issue
10
fYear
1979
Firstpage
804
Lastpage
805
Abstract
In the above paper,1the authors have defined complete test, closed fault set, fault set graph, and undetected fault set as follows.
Keywords
Circuit faults; Digital systems; Electrical fault detection; Fault detection; Intelligent networks; Logic devices; Metastasis; Paper making; Synchronization; Testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1979.1675254
Filename
1675254
Link To Document