Title :
On Redundancy and Fault Detection in Sequential Circuits
Author :
Abramovici, Miron ; Breuer, Melvin A.
Author_Institution :
Department of Electrical Engineering, University of Southern California
Abstract :
In this correspondence we show that the well-known concepts of redundancy and undetectability of a stuck-at fault, which are equivalent in combinational circuits, are not equivalent in sequential circuits. We also show that some faults in sequential circuits, which are undetectable (by "conventional" methods of testing), are detectable by transition count testing methods.
Keywords :
Combinational and sequential circuits; fault detection; redundancy; testing; transition count testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Flip-flops; Radio frequency; Redundancy; Sequential analysis; Sequential circuits; Combinational and sequential circuits; fault detection; redundancy; testing; transition count testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675267
