DocumentCode :
1139031
Title :
Interface contribution to GaAs/Ge heterojunction solar cell efficiency
Author :
Bullock, John N. ; Wu, C.H. ; Wise, Joseph F.
Author_Institution :
Dept. of Electr. Eng., Missouri Univ., Rolla, MO, USA
Volume :
36
Issue :
7
fYear :
1989
fDate :
7/1/1989 12:00:00 AM
Firstpage :
1238
Lastpage :
1243
Abstract :
A solar cell formed by growing a p-on-n AlGaAs/GaAs heteroface homojunction on a thin Ge substrate is studied by investigating the contribution of the GaAs/Ge heterostructure to the solar-cell efficiency. The existence of interface states is required in the absence of a Ge p-n junction to produce the photovoltaic effect with an open-circuit voltage enhancement as experimentally observed. Dark current-voltage characteristics of the GaAs/Ge heterojunction are calculated when the carrier transport is by thermionic emission and tunneling mechanisms. The evaluations correctly explain the observed changes of efficiency, the decrease of fill factor, the increase of open-circuit voltage, and the insignificant change of short-circuit current as compared to a GaAs/GaAs solar cell. It the short-circuit current from the heterojunction is on the order of 25 mA/cm2, which is less than that of the p-n junction cell, the reduction of the solar cell efficiency is about 0.5-1.5% over a wide range of GaAs/Ge doping concentrations. Very few interface states tend to yield a diode-like dark I-V curve
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; interface electron states; solar cells; tunnelling; AlGaAs-GaAs; Ge; dark current-voltage characteristics; diode-like dark I-V curve; fill factor; heteroface homojunction; heterojunction solar cell; interface states; open-circuit voltage; open-circuit voltage enhancement; photovoltaic effect; short-circuit current; solar-cell efficiency; thermionic emission; tunneling mechanisms; Current-voltage characteristics; Gallium arsenide; Heterojunctions; Interface states; P-n junctions; Photovoltaic cells; Photovoltaic effects; Thermionic emission; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.30928
Filename :
30928
Link To Document :
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