• DocumentCode
    1139287
  • Title

    Fully symmetric cooled CMOS on (110) plane

  • Author

    Aoki, Masaaki ; Yano, Kazuo ; Masuhara, Toshiaki ; Shimohigashi, Katsuhiro

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    36
  • Issue
    8
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    1429
  • Lastpage
    1433
  • Abstract
    A cooled CMOS device using dual-polysilicon gates, (110) Si substrates, lightly doped drains with doping concentrations of 1014 cm-2, and no channel implant is described. It is found that the peak mobility of a p+ polysilicon gate pMOS transistor on a (110) plane is 1.6 times larger than that on a (100) plane at 77 K. This pMOS transistor si very promising for use at 77 K because of its steeper subthreshold slope and higher hole mobility. The design has realized fully symmetrical cooled CMOS devices with 0.8-μm gates in which saturation currents and transductances of both n and pMOS transistors have been almost equalized. This fully symmetric cooled CMOS increases the ring oscillator speed by a factor of 1.2 and allows flexible CMOS circuit design that allows effective use of NOR gates
  • Keywords
    CMOS integrated circuits; integrated circuit technology; low-temperature techniques; (110) plane; 0.8 micron; 77 K; NOR gates; Si substrates; cooled CMOS device; doping concentrations; dual-polysilicon gates; flexible CMOS circuit design; hole mobility; lightly doped drains; p+ polysilicon gate pMOS transistor; peak mobility; ring oscillator speed; saturation currents; subthreshold slope; transductances; Boron; CMOS technology; Circuits; Doping; Hot carriers; Implants; MOS devices; MOSFETs; Temperature; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.30955
  • Filename
    30955