Title :
Fully symmetric cooled CMOS on (110) plane
Author :
Aoki, Masaaki ; Yano, Kazuo ; Masuhara, Toshiaki ; Shimohigashi, Katsuhiro
Author_Institution :
Hitachi Ltd., Tokyo, Japan
fDate :
8/1/1989 12:00:00 AM
Abstract :
A cooled CMOS device using dual-polysilicon gates, (110) Si substrates, lightly doped drains with doping concentrations of 1014 cm-2, and no channel implant is described. It is found that the peak mobility of a p+ polysilicon gate pMOS transistor on a (110) plane is 1.6 times larger than that on a (100) plane at 77 K. This pMOS transistor si very promising for use at 77 K because of its steeper subthreshold slope and higher hole mobility. The design has realized fully symmetrical cooled CMOS devices with 0.8-μm gates in which saturation currents and transductances of both n and pMOS transistors have been almost equalized. This fully symmetric cooled CMOS increases the ring oscillator speed by a factor of 1.2 and allows flexible CMOS circuit design that allows effective use of NOR gates
Keywords :
CMOS integrated circuits; integrated circuit technology; low-temperature techniques; (110) plane; 0.8 micron; 77 K; NOR gates; Si substrates; cooled CMOS device; doping concentrations; dual-polysilicon gates; flexible CMOS circuit design; hole mobility; lightly doped drains; p+ polysilicon gate pMOS transistor; peak mobility; ring oscillator speed; saturation currents; subthreshold slope; transductances; Boron; CMOS technology; Circuits; Doping; Hot carriers; Implants; MOS devices; MOSFETs; Temperature; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on