Title :
Design of microwave ENZ sensor for contamination detection in liquids using SIW technology
Author :
Jha, Abhishek Kumar ; Akhtar, M. Jaleel
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
Abstract :
A novel planar epsilon-near-zero (ENZ) tunnel sensor is designed using the surface integrated waveguide (SIW) technology for detection of contamination in various liquid solutions. The contamination is detected in terms of the volumetric percentage by measuring the change in the dielectric properties of reference and adulterated solutions. The method is based on the cavity perturbation technique in which the tunneling electric field gets perturbed by the sample inclusion. An accurate sensitivity analysis shows the advantage of the proposed ENZ sensor over the conventional SIW cavity for accurate measurement of liquid contamination. Various types of adulterated liquid solutions are tested with the help of the specially designed sample holder, and the results are found to in good agreement with the theoretical values.
Keywords :
contamination; dielectric measurement; inspection; microwave detectors; microwave measurement; substrate integrated waveguides; SIW technology; cavity perturbation technique; contamination detection; dielectric properties; liquid solution contamination; microwave ENZ sensor; planar epsilon-near-zero tunnel sensor; surface integrated waveguide technology; tunneling electric field; Cavity resonators; Contamination; Liquids; Microwave measurement; Pollution measurement; Tunneling; Water pollution; Epsilon-near-zero (ENZ); liquid dielectric sensor; microwave sensors; permittivity measurement; substrate integrated waveguide (SIW);
Conference_Titel :
Microwave and RF Conference (IMaRC), 2014 IEEE International
Conference_Location :
Bangalore
DOI :
10.1109/IMaRC.2014.7039042
