Single Event Transient Propagation Through Digital Optocouplers

Author

Adell, P.C. ; Mion, O. ; Schrimpf, R.D. ; Chatry, C. ; Calvel, P. ; Melotte, M.R.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

52

Issue

4

fYear

2005

Firstpage

1136

Lastpage

1139

Abstract

A new approach for assessing the risk of upsetting digital optocouplers due to the propagation of single event transients (SETs) is proposed. The optocoupler\´s input current $(I_f)$ and propagation time $(t_ pHL)$ are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semiconductor LM139 is detailed to validate the concept.

Keywords

integrated optoelectronics; nuclear electronics; opto-isolators; radiation effects; 6N140 optocoupler; National Semiconductor LM139; analogue single event transient propagation; digital optocouplers; input current; propagation time; radiation hardness assurance; Analog integrated circuits; Application software; Application specific integrated circuits; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Protection; Protons; Switches; Voltage control; Analog single event transients (SETs); SET propagation; optocouplers; radiation hardness assurance;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2005.851746

Filename

1495818