DocumentCode :
1139622
Title :
Comments on "Redundancy Testing in Combinational Networks"
Author :
Smith, James E.
Author_Institution :
Department of Electrical and Computer Engineering, University of Wisconsin-Madison
Issue :
3
fYear :
1979
fDate :
3/1/1979 12:00:00 AM
Firstpage :
261
Lastpage :
262
Abstract :
In the above-mentioned paper1, Lee and Davidson present an algorithm for detecting all single redundant lines in a tree-type NAND network. In order to test for a single redundancy in a nontree network, they suggest replicating portions of the network (those which fan out) to get an equivalent tree-type NAND network. The algorithm for detecting single redundancies can then be applied to the equivalent tree-type network. However, a problem may arise if a single redundant connection in the original network, when replicated, leads to a set of connections all of which are irredundant when considered individually, but which are redundant when considered as a group. Lee and Davidson state that it is not known whether such a situation can occur. However, after some discussion they resolve the problem to the following question which they leave open: Can a set of 4 or more connections in a tree network corresponding to a single connection in the nontree network be redundant while any proper subset of the 4 or more lines is irredundant? The answer to this question will indicate whether the extension of their algorithm to nontree networks will always work.
Keywords :
Circuit faults; Circuit testing; Decoding; Fault detection; Intelligent networks; Logic testing; Random access memory; Redundancy;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1979.1675332
Filename :
1675332
Link To Document :
بازگشت