Title :
Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques
Author :
Collantes, Juan-Mari ; Pollard, Roger D. ; Sayed, Mohamed
Author_Institution :
Electr. & Electron. Dept., Univ. of the Basque Country, Bilbao, Spain
fDate :
12/1/2002 12:00:00 AM
Abstract :
Device mismatch seriously degrades accuracy in noise figure characterization. The suitability of corrections to the gain definitions for a more precise noise figure evaluation for mismatched devices is investigated and compared to classical techniques. The effects of device mismatch on the noise figure of the noise-meter receiver and its impact on the final accuracy are analyzed.
Keywords :
electric noise measurement; DUT mismatch; Y-factor technique; gain; noise figure measurement; noise-meter receiver; Circuit noise; Degradation; Gain measurement; Impedance; Mobile communication; Noise figure; Noise measurement; Power measurement; Temperature measurement; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.808015
