• DocumentCode
    1139827
  • Title

    Radiation effects on a radiation-tolerant CMOS active pixel sensor

  • Author

    Hopkinson, G.R. ; Mohammadzadeh, A. ; Harboe-Sorensen, R.

  • Author_Institution
    Sira Ltd., Chislehurst, UK
  • Volume
    51
  • Issue
    5
  • fYear
    2004
  • Firstpage
    2753
  • Lastpage
    2762
  • Abstract
    A comprehensive cobalt60, proton, and heavy ion evaluation of the Fillfactory STAR-250 CMOS active pixel sensor has been performed for space applications up to 100 krd(Si). It was possible to eliminate image lag by adjustment of the bias voltage and this allowed a reduction in proton-induced dark signal. Both cobalt60 and proton irradiation produced a decrease in responsivity, which is thought to be due to total dose effects. There was also an increase in photoresponse nonuniformity (PRNU). No major single event effects (latch-up or functional interrupt) where seen at the maximum linear energy transfer (LET) of 68MeV/(mg/cm/sup 2/).
  • Keywords
    CMOS image sensors; dosimetry; proton effects; Fillfactory STAR-250 CMOS active pixel sensor; bias voltage; cobalt60 irradiation; functional interrupt; heavy ion evaluation; latch-up; maximum linear energy transfer; photoresponse nonuniformity; proton irradiation; proton-induced dark signal; radiation effects; radiation-tolerant CMOS active pixel sensor; single event effects; space applications; total dose effects; CMOS image sensors; CMOS technology; Charge coupled devices; Clocks; Energy exchange; Pixel; Protons; Radiation effects; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.835108
  • Filename
    1344413