DocumentCode
1139827
Title
Radiation effects on a radiation-tolerant CMOS active pixel sensor
Author
Hopkinson, G.R. ; Mohammadzadeh, A. ; Harboe-Sorensen, R.
Author_Institution
Sira Ltd., Chislehurst, UK
Volume
51
Issue
5
fYear
2004
Firstpage
2753
Lastpage
2762
Abstract
A comprehensive cobalt60, proton, and heavy ion evaluation of the Fillfactory STAR-250 CMOS active pixel sensor has been performed for space applications up to 100 krd(Si). It was possible to eliminate image lag by adjustment of the bias voltage and this allowed a reduction in proton-induced dark signal. Both cobalt60 and proton irradiation produced a decrease in responsivity, which is thought to be due to total dose effects. There was also an increase in photoresponse nonuniformity (PRNU). No major single event effects (latch-up or functional interrupt) where seen at the maximum linear energy transfer (LET) of 68MeV/(mg/cm/sup 2/).
Keywords
CMOS image sensors; dosimetry; proton effects; Fillfactory STAR-250 CMOS active pixel sensor; bias voltage; cobalt60 irradiation; functional interrupt; heavy ion evaluation; latch-up; maximum linear energy transfer; photoresponse nonuniformity; proton irradiation; proton-induced dark signal; radiation effects; radiation-tolerant CMOS active pixel sensor; single event effects; space applications; total dose effects; CMOS image sensors; CMOS technology; Charge coupled devices; Clocks; Energy exchange; Pixel; Protons; Radiation effects; Testing; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.835108
Filename
1344413
Link To Document