DocumentCode :
1139855
Title :
Comments on the reliability of GaAs Stripe-Geometry juntion lasers
Author :
Ripper, José E.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Volume :
6
Issue :
6
fYear :
1970
fDate :
6/1/1970 12:00:00 AM
Firstpage :
372
Lastpage :
373
Abstract :
Experiments with stripe-geometry lasers show that Byer\´s results for degradation of pulsed diodes can not be generalized to CW conditions. Diodes subjected to CW injection-current density of 
A/cm2show very little degradation after close to 1000 hours of operation at room temperature.
A/cm2show very little degradation after close to 1000 hours of operation at room temperature.Keywords :
Current density; Degradation; Diodes; Gallium arsenide; Heat sinks; Optical pulses; Power lasers; Pulse measurements; Temperature; Testing;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1970.1076468
Filename :
1076468
Link To Document :
