Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions

Author

Koga, R. ; George, J. ; Swift, G. ; Yui, C. ; Edmonds, L. ; Carmichael, C. ; Langley, T. ; Murray, P. ; Lanes, K. ; Napier, M.

Author_Institution

Aerosp. Corp., El Segundo, CA, USA

Volume

51

Issue

5

fYear

2004

Firstpage

2825

Lastpage

2833

Abstract

A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-II field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relationship appears to exist between the heavy ion and proton sensitivities due to effects such as multiple-bit upsets and elastic nuclear scattering.

Keywords

field programmable gate arrays; proton effects; semiconductor device testing; Xilinx Virtex-II FPGA; elastic nuclear scattering; fabricated test samples; field programmable gate array; heavy ion radiation effects; heavy-ion induced single event effect sensitivities; multiple-bit upsets; proton radiation effects; proton-induced single event effect sensitivities; semiconductor device testing; single event functional interrupt; single event upset; Field programmable gate arrays; Ion radiation effects; Ionization; Laboratories; Proton radiation effects; SRAM chips; Scattering; Semiconductor device testing; Single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2004.835057

Filename

1344424