Title :
Characteristics of single-event upsets in a fabric switch (AD8151)
Author :
Buchner, Stephen ; Carts, Martin A. ; McMorrow, Dale ; Kim, Hak ; Marshall, Paul W. ; LaBel, Kenneth A.
Author_Institution :
QSS Group Inc., Seabrook, MD, USA
Abstract :
Two types of single-event effects-bit errors and single-event functional interrupts-were observed during heavy-ion testing of the AD8151 crosspoint switch. Bit errors occurred in bursts with the average number of bits in a burst being dependent on both the ion linear energy transfer (LET) and on the data rate. A pulsed laser was used to identify the locations on the chip where the bit errors and single-event functional interrupts occurred. Bit errors originated in the switches, drivers, and output buffers. Single-event functional interrupts originated in the second-rank latch containing the data specifying the state of each switch in the 33×17 matrix.
Keywords :
buffer circuits; driver circuits; error statistics; flip-flops; interrupts; ion beam effects; laser beam effects; network synthesis; switches; AD8151 crosspoint switch; bit errors; drivers; fabric switch; heavy-ion testing; ion linear energy transfer; output buffers; pulsed laser; second-rank latch; single-event functional interrupts; single-event upsets; Communication switching; Fabrics; Instruments; Joining processes; Latches; NASA; Optical pulses; Optical switches; SONET; Storage area networks; Bit errors; fabric switch; heavy ions; pulsed laser; single-event functional interrupt;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.835085
