A comparative study between two neutron facilities regarding SEU

Author

Granlund, Thomas ; Granbom, Bo ; Olsson, Nils

Author_Institution

Electromagn. Technol. Div., Saab Avionics AB, Linkoping, Sweden

Volume

51

Issue

5

fYear

2004

Firstpage

2922

Lastpage

2926

Abstract

We report on a comparative study between two neutron facilities used for SEU studies, namely the Weapons Neutron Research facility at Los Alamos National Laboratory (a white neutron source), and the The Svedberg Laboratory in Sweden (a quasimono-energetic neutron source). The soft error rates generated from TSL are in excellent agreement with those from WNR. Moreover, an increase of the SER for small process technologies was observed.

Keywords

CMOS integrated circuits; CMOS memory circuits; SRAM chips; avionics; neutron effects; semiconductor device testing; CMOS memory integrated circuits; SEU studies; SRAM chips; Svedberg Laboratory; Weapons Neutron Research facility; aircraft electronics; neutron facilities; neutron radiation effects; quasimonoenergetic neutron source; semiconductor device radiation effects; semiconductor device testing; soft error rates; Aerospace electronics; Circuit testing; Consumer electronics; Electronic equipment testing; Laboratories; Neutrons; Radiation effects; Random access memory; Single event upset; Weapons; Aircraft electronics; CMOS memory integrated circuits; SRAM chips; neutron radiation effects; radiation effects; semiconductor device radiation effects; semiconductor device testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2004.835070

Filename

1344439