• DocumentCode
    1140375
  • Title

    Matching two perspective views

  • Author

    Weng, Juyang ; Ahuja, Narendra ; Huang, Thomas S.

  • Author_Institution
    Beckman Inst., Illinois Univ., Urbana, IL, USA
  • Volume
    14
  • Issue
    8
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    806
  • Lastpage
    825
  • Abstract
    A computational approach to image matching is described. It uses multiple attributes associated with each image point to yield a generally overdetermined system of constraints, taking into account possible structural discontinuities and occlusions. In the algorithm implemented, intensity, edgeness, and cornerness attributes are used in conjunction with the constraints arising from intraregional smoothness, field continuity and discontinuity, and occlusions to compute dense displacement fields and occlusion maps along the pixel grids. The intensity, edgeness, and cornerness are invariant under rigid motion in the image plane. In order to cope with large disparities, a multiresolution multigrid structure is employed. Coarser level edgeness and cornerness measures are obtained by blurring the finer level measures. The algorithm has been tested on real-world scenes with depth discontinuities and occlusions. A special case of two-view matching is stereo matching, where the motion between two images is known. The algorithm can be easily specialized to perform stereo matching using the epipolar constraint
  • Keywords
    pattern recognition; picture processing; blurring; cornerness attributes; dense displacement fields; depth discontinuities; discontinuity; edgeness; field continuity; image matching; intraregional smoothness; multiresolution multigrid structure; occlusions; pattern recognition; pixel grids; stereo matching; structural discontinuities; two perspective views matching; Equations; Image analysis; Image matching; Image motion analysis; Layout; Motion analysis; Motion estimation; Optical sensors; Stereo vision; Vectors;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.149592
  • Filename
    149592