Surface parametrization and curvature measurement of arbitrary 3-D objects: five practical methods

Author

Stokely, Ernest M. ; Wu, Shang You

Author_Institution

Dept. of Biomed. Eng., Alabama Univ., Birmingham, AL, USA

Volume

14

Issue

8

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

833

Lastpage

840

Abstract

Curvature sampling of arbitrary, fully described 3-D objects (e.g. tomographic medical images) is difficult because of surface patch parameterization problems. Five practical solutions are presented and characterized-the Sander-Zucker approach, two novel methods based on direct surface mapping, a piecewise linear manifold technique, and a turtle geometry method. One of the new methods, called the cross patch (CP) method, is shown to be very fast, robust in the presence of noise, and is always based on a proper surface parameterization, provided the perturbations of the surface over the patch neighborhood are isotropically distributed

Keywords

pattern recognition; picture processing; 3D images; Sander-Zucker approach; cross patch; curvature measurement; curvature sampling; direct surface mapping; picture processing; piecewise linear manifold technique; shape recognition; surface patch parameterization; turtle geometry method; Biomedical engineering; Biomedical imaging; Biomedical measurements; Computer vision; Image analysis; Image sampling; Inspection; Object recognition; Shape; Surface emitting lasers;

fLanguage

English

Journal_Title

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Publisher

ieee

ISSN

0162-8828

Type

jour

DOI

10.1109/34.149594

Filename

149594