Title :
Comment on "When to Use Random Testing"
Author :
Schneck, Paul B.
Author_Institution :
Goddard Space Flight Center
Abstract :
This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.
Keywords :
Fan-in; primary inputs; Algebra; Computer aided software engineering; Costs; Filtering; Hardware; Indium tin oxide; Testing; Fan-in; primary inputs;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675415