DocumentCode :
1140403
Title :
Comment on "When to Use Random Testing"
Author :
Schneck, Paul B.
Author_Institution :
Goddard Space Flight Center
Issue :
8
fYear :
1979
Firstpage :
580
Lastpage :
581
Abstract :
This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.
Keywords :
Fan-in; primary inputs; Algebra; Computer aided software engineering; Costs; Filtering; Hardware; Indium tin oxide; Testing; Fan-in; primary inputs;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1979.1675415
Filename :
1675415
Link To Document :
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