Title :
Properties of Transparent Shortened Codes for Memories With Stuck-at Faults
Author :
Sundberg, Carl-erik
Author_Institution :
Telecommunication Theory, University of Lund
Abstract :
This correspondence deals with the problem of selecting optimal shortened d = 3 Hamming codes and d = 4 extended Hamming codes. The studied codes are transparent codes, minimum column weight codes, and codes with a minimum number of codewords of minimum weight. It is concluded that a shortened code normally does not combine the properties of being transparent, being of minimum column weight type and having a minimum number of codewords of minimum weight. Furthermore, it is concluded that the weight distribution of a shortened code depends on the selected set of shortened information symbols for a given fixed number of shortened symbols. The correspondence also gives examples of good 22, 16 codes.
Keywords :
Erasure and error decoding; Hamming code; erasure correcting code; error correcting code; fault-tolerant system; stuck-at fault; transparent code; Block codes; Computer errors; Decoding; Error correction; Error correction codes; Fault location; Fault tolerant systems; Linear code; Parity check codes; Semiconductor memory; Erasure and error decoding; Hamming code; erasure correcting code; error correcting code; fault-tolerant system; stuck-at fault; transparent code;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675438
