Title :
Effect of random errors in planar near-field measurement
Author :
Newell, Allen C. ; Stubenrauch, Carl F.
Author_Institution :
NBS, Boulder, CO, USA
fDate :
6/1/1988 12:00:00 AM
Abstract :
Expressions that relate the signal-to-noise ratio in the near field to the signal-to-noise ratio in the far field are developed. The expressions are then used to predict errors in far-field patterns obtained from near-field data. A technique for measuring the noise in the calculated far-field pattern by calculating the spectrum in the evanescent region from a single-dimensional oversampled scan is also described
Keywords :
antenna radiation patterns; antennas; electric field measurement; error analysis; random processes; antennas; evanescent region; far field; planar near-field measurement; random errors; signal-to-noise ratio; single-dimensional oversampled scan; spectrum; Antenna measurements; Antenna theory; Antennas and propagation; Electromagnetic measurements; Insertion loss; Loss measurement; Noise measurement; Probes; Sampling methods; Signal to noise ratio;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
