Title :
Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets
Author :
Kodandapani, K.L. ; Pradhan, Dhiraj K.
Author_Institution :
Department of Computer Science, Wichita State University
Abstract :
The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults.
Keywords :
Boolean difference; bridging faults; intergate bridging faults; intragate bridging faults; irredundant networks; redundancy; short circuits; two-level networks; unate networks; undetectability; Circuit faults; Circuit testing; Combinational circuits; DH-HEMTs; Electrical fault detection; Fault detection; Large scale integration; Redundancy; Sequential circuits; Sufficient conditions; Boolean difference; bridging faults; intergate bridging faults; intragate bridging faults; irredundant networks; redundancy; short circuits; two-level networks; unate networks; undetectability;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675457
