DocumentCode
1140825
Title
Correction to "Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions"
Author
Brederlow, Ralf ; Weber, W. ; Schmitt-Landsiedel, Doris ; Thewes, Roland
Volume
49
Issue
12
fYear
2002
Firstpage
2373
Lastpage
2373
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2003.808739
Filename
1178012
Link To Document