DocumentCode :
1140933
Title :
Verification of magnetized electron series resonance from 1-D plasma diode noise current
Author :
Qiu, W. ; Birdsall, C.K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Volume :
30
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
2035
Lastpage :
2041
Abstract :
A plasma diode appears resistive to an external observer at the magnetized electron series resonance (MESR). The authors derive the MESR resonant frequencies from an equivalent circuit model using linear cold plasma theory. The noise current from a decaying plasma is predicted to exhibit the MESR resonant frequencies and is verified by observing the spectra of the noise currents in 1d3v simulations. The spectra compare well with the theoretical values, which depend on the (central) plasma density and the sheath thickness. The latter is obtained from the (warm) plasma simulations.
Keywords :
noise; plasma diodes; plasma simulation; plasma transport processes; 1-D plasma diode noise current; 1d3v simulations; decaying plasma; equivalent circuit model; linear cold plasma theory; magnetized electron series resonance; magnetized plasma; noise current; noise currents; plasma density; resonant frequencies; sheath thickness; warm plasma simulations; Circuit noise; Diodes; Electrons; Equivalent circuits; Magnetic resonance; Plasma density; Plasma sheaths; Plasma simulation; Predictive models; Resonant frequency;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2002.805324
Filename :
1178021
Link To Document :
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