• DocumentCode
    1140982
  • Title

    Reliability and Performance of Error-Correcting Memory and Register Arrays

  • Author

    Elkind, Steven A. ; Siewiorek, Daniel P.

  • Author_Institution
    Department of Electrical Engineering, Carnegie- Mellon University
  • Issue
    10
  • fYear
    1980
  • Firstpage
    920
  • Lastpage
    927
  • Abstract
    A brief survey of memory chip failure modes shows that partial chip failures are the dominant failure mode. A single error-correcting (SEC) code memory model is developed based on the results of the survey. The effect of memory support circuitry, often ignored, is included. Examples illustrate that the support circuitry dominates the memory system reliability for wide ranges of memory system parameters.
  • Keywords
    Error-correcting codes; fault tolerance; memory; performance; reliability; Block codes; Circuits; Costs; Degradation; Error correction; Error correction codes; Fault tolerant systems; Predictive models; Registers; Reliability; Error-correcting codes; fault tolerance; memory; performance; reliability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675475
  • Filename
    1675475
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1140982