• DocumentCode
    1141234
  • Title

    Dual-Mode Logic for Function-Independent Fault Testing

  • Author

    Dasgupta, Sumit ; Hartmann, Carlos R P ; Rudolph, Luther D.

  • Author_Institution
    IBM Data Systems Division
  • Issue
    11
  • fYear
    1980
  • Firstpage
    1025
  • Lastpage
    1029
  • Abstract
    This correspondence presents a oncept of function-independent testing of digital networks. It is based on the idea of dual-mode logic where the network is tested in one mode while the normal function of the network is performed in another mode, with neither mode interfering with the other. This correspondence simultaneously defines the structure of modules with the above characteristics such that combinational and sequential networks built with them can be tested with two and six function-independent tests, respectively.
  • Keywords
    Control inputs; data inputs; dual-mode combinational logic network; dual-mode sequential logic network; function-independent tests; stuck-at-faults; Bonding; Circuit faults; Circuit testing; Fault detection; Hamming distance; Logic testing; Network-on-a-chip; Packaging; Performance evaluation; Sequential analysis; Control inputs; data inputs; dual-mode combinational logic network; dual-mode sequential logic network; function-independent tests; stuck-at-faults;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675500
  • Filename
    1675500