DocumentCode
1141234
Title
Dual-Mode Logic for Function-Independent Fault Testing
Author
Dasgupta, Sumit ; Hartmann, Carlos R P ; Rudolph, Luther D.
Author_Institution
IBM Data Systems Division
Issue
11
fYear
1980
Firstpage
1025
Lastpage
1029
Abstract
This correspondence presents a oncept of function-independent testing of digital networks. It is based on the idea of dual-mode logic where the network is tested in one mode while the normal function of the network is performed in another mode, with neither mode interfering with the other. This correspondence simultaneously defines the structure of modules with the above characteristics such that combinational and sequential networks built with them can be tested with two and six function-independent tests, respectively.
Keywords
Control inputs; data inputs; dual-mode combinational logic network; dual-mode sequential logic network; function-independent tests; stuck-at-faults; Bonding; Circuit faults; Circuit testing; Fault detection; Hamming distance; Logic testing; Network-on-a-chip; Packaging; Performance evaluation; Sequential analysis; Control inputs; data inputs; dual-mode combinational logic network; dual-mode sequential logic network; function-independent tests; stuck-at-faults;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1980.1675500
Filename
1675500
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