An Experimental Investigation of Higher Order Mode Suppression in TEM Cells

Author

Deng, Shaowei ; Pommerenke, David ; Hubing, Todd ; Shin, Dongshik

Author_Institution

Univ. of Missouri-Rolla, Rolla, MO

Volume

50

Issue

2

fYear

2008

fDate

5/1/2008 12:00:00 AM

Firstpage

416

Lastpage

419

Abstract

Transverse electromagnetic (TEM) cells can be used to evaluate the electric and magnetic fields coupling from integrated circuits (ICs). The propagation and reflection of higher order modes in the cells limits the bandwidth of TEM cells. This paper investigates several methods for suppressing higher order modes in TEM cells in order to extend the applicable frequency range without changing the test topology. Numerical models and measurements of a modified TEM cell demonstrate how higher order mode suppression techniques can extend the useful frequency range of a TEM cell for IC measurements from 1 to 2.5 GHz.

Keywords

TEM cells; electromagnetic coupling; integrated circuit testing; TEM cells; electric-magnetic field coupling; higher order mode suppression; integrated circuits; transverse electromagnetic cells; Bandwidth; Circuit testing; Coupling circuits; Electromagnetic coupling; Electromagnetic fields; Electromagnetic propagation; Electromagnetic reflection; Frequency measurement; Magnetic fields; TEM cells; Higher order mode; resonant frequency; slotted septum; transverse electromagnetic (TEM) cell;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2008.919028

Filename

4494798