DocumentCode
1141445
Title
Transient intensity noise of semiconductor lasers: experiments and comparison with theory
Author
Czylwik, Andreas ; Eberle, Wolfgang
Author_Institution
Tech. Hochschule Darmstadt, Inst. fuer Uebertragungstech., West Germany
Volume
26
Issue
2
fYear
1990
fDate
2/1/1990 12:00:00 AM
Firstpage
225
Lastpage
230
Abstract
An experimental setup for the measurement of the nonstationary intensity fluctuations during the turn-on transient of semiconductor lasers is presented. Measurements are carried out and compared with simulations, which are based on rate equations with Langevin fluctuation functions. Good agreement between theory and measurements is found, and it is confirmed that the nonstationary intensity noise can be interpreted as timing jitter
Keywords
electron device noise; functions; semiconductor junction lasers; Langevin fluctuation functions; nonstationary intensity fluctuations; rate equations; semiconductor laser noise; semiconductor lasers; timing jitter; transient intensity noise; turn-on transient; Equations; Fluctuations; Laser noise; Laser theory; Noise measurement; Optical noise; Optical pulse generation; Oscilloscopes; Sampling methods; Semiconductor device noise; Semiconductor lasers; Timing jitter;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.44953
Filename
44953
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