• DocumentCode
    1141643
  • Title

    Battery-powered digital CMOS design

  • Author

    Pedram, Massoud ; Wu, Qing

  • Author_Institution
    Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    10
  • Issue
    5
  • fYear
    2002
  • Firstpage
    601
  • Lastpage
    607
  • Abstract
    In this paper, we consider the problem of maximizing the battery life (or duration of service) in battery-powered CMOS circuits. We first show that the battery efficiency (or utilization factor) decreases as the average discharge current from the battery increases. The implication is that the battery life is a superlinear function of the average discharge current. Next we show that even if the average discharge current remains the same, different discharge current profiles (distributions) may result in very different battery lifetimes. In particular, the maximum battery life is achieved when the variance of the discharge current distribution is minimized. Analytical derivations and experimental results underline the importance of the correct modeling of the battery-hardware system as a whole and provide a more accurate basis (i.e., the battery discharge times delay product) for comparing various low-power optimization methodologies and techniques targeted toward battery-powered electronics. Finally, we calculate the optimal value of V/sub dd/ for a battery-powered VLSI circuit so as to minimize the product of the battery discharge times circuit delay.
  • Keywords
    CMOS digital integrated circuits; SPICE; VLSI; circuit optimisation; circuit simulation; integrated circuit design; low-power electronics; VLSI; average discharge current; battery life; battery lifetimes; digital CMOS design; discharge current profiles; low-power optimization methodologies; superlinear function; utilization factor; variance; Batteries; Circuits; Current distribution; DC-DC power converters; Delay effects; Design methodology; Dynamic voltage scaling; Energy consumption; Optimization methods; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2002.801566
  • Filename
    1178083