Title :
A method for determination of microwave surface impedance of high-T c thick film and bulk superconductors
Author :
Wu, Zhipeng ; Davis, Lionel E.
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
fDate :
8/1/1994 12:00:00 AM
Abstract :
A resonator method is presented which enables R, and X8 to be determined as a function of temperature with the exclusion of the thermal expansion effect. Results for R, and X, are given for a bulk YBCO sample at 13 GHz over the range 15-190 K. Good agreement with the “enhanced” two-fluid model is found for λ(T), and λ=657 nm at 77 K
Keywords :
barium compounds; electric impedance measurement; high-temperature superconductors; microwave measurement; surface conductivity; yttrium compounds; 13 GHz; 15 to 190 K; 657 nm; 77 K; YBCO sample; YBaCuO; bulk superconductors; cylindrical cavity; high-Tc thick film superconductor; microwave surface impedance; resonator method; surface reactance; surface resistance; temperature dependence; thermal expansion; two-fluid model; Electrical resistance measurement; Magnetic field measurement; Microwave theory and techniques; Superconductivity; Surface impedance; Surface resistance; Temperature; Thermal expansion; Thick films; Yttrium barium copper oxide;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
