Title :
Random Field Model for Integration of Local Information and Global Information
Author :
Toyoda, Takahiro ; Hasegawa, Osamu
Author_Institution :
Tokyo Inst. of Technol., Yokohama
Abstract :
This paper presents a proposal of a general framework that explicitly models local information and global information in a conditional random field. The proposed method extracts global image features as well as local ones and uses them to predict the scene of the input image. Scene-based top-down information is generated based on the predicted scene. It represents a global spatial configuration of labels and category compatibility over an image. Incorporation of the global information helps to resolve local ambiguities and achieves locally and globally consistent image recognition. In spite of the model´s simplicity, the proposed method demonstrates good performance in image labeling of two datasets.
Keywords :
feature extraction; image recognition; category compatibility; conditional random field; global image features; global information; image labeling; image recognition; local information integration; random field model; Markov random fields; Pixel classification; Scene Analysis; Algorithms; Computer Simulation; Data Interpretation, Statistical; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Systems Integration;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2008.105