Title :
Comprehensive Approach to High-Performance Server Chipset Debug
Author :
Parulkar, Ishwar ; Turumella, Babu
Author_Institution :
Sun Microsyst., Santa Clara, CA, USA
Abstract :
This article describes a comprehensive approach for silicon debug of a server chipset that includes a high-performance, third-generation chip-multithreaded (CMT) Sparc microprocessor. Efficiently debugging the chipset required a combination of debug features in silicon and system platforms, firmware support for debug, test generation tools, and debug data interpretation tools. Several useful lessons were learned in the process.
Keywords :
automatic test software; firmware; microprocessor chips; debug data interpretation tools; firmware support; server chipset debug; test generation tools; third-generation chip-multithreaded microprocessor; Application specific integrated circuits; Computer bugs; Error correction; Geometry; Hardware; Microprocessors; Silicon; Sun; System testing; Yarn; CMT Sparc microprocessor; RAS; SerDes; debug; design and test; multithreaded processors; server chipset; test generation; verification;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.53
