Core-Based Testing of Embedded Mixed-Signal Modules in a SoC

Author

Zivkovic, Vladimir A. ; Schat, Jan ; van der Heyden, F. ; Seuren, Geert

Author_Institution

NXP Semicond., Netherlands

Volume

26

Issue

3

fYear

2009

Firstpage

78

Lastpage

86

Abstract

This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.

Keywords

IEEE standards; design for testability; embedded systems; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; system-on-chip; DFT architecture; IEEE test standard; RF module; SoC; core-based design; core-based testing; embedded mixed-signal module; industrial product; test development approach; Automatic testing; Circuit testing; Computer architecture; Consumer electronics; Design for testability; Electronic equipment testing; Lead compounds; Production; Radio frequency; Registers; DFT architecture; computer-aided test; core-based test; mixed-signal test;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2009.55

Filename

5167510