Title :
Core-Based Testing of Embedded Mixed-Signal Modules in a SoC
Author :
Zivkovic, Vladimir A. ; Schat, Jan ; van der Heyden, F. ; Seuren, Geert
Author_Institution :
NXP Semicond., Netherlands
Abstract :
This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.
Keywords :
IEEE standards; design for testability; embedded systems; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; system-on-chip; DFT architecture; IEEE test standard; RF module; SoC; core-based design; core-based testing; embedded mixed-signal module; industrial product; test development approach; Automatic testing; Circuit testing; Computer architecture; Consumer electronics; Design for testability; Electronic equipment testing; Lead compounds; Production; Radio frequency; Registers; DFT architecture; computer-aided test; core-based test; mixed-signal test;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.55
