Title :
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
Author_Institution :
IBM T. J. Watson Research Center
fDate :
5/1/1980 12:00:00 AM
Abstract :
Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection.
Keywords :
Error latency; intermittent fault detection; irredundant circuit; maximum likelihood estimator; random testing; Autocorrelation; Circuit faults; Circuit testing; Clocks; Combinational circuits; Electrical fault detection; Equations; Fault detection; Thermal pollution; Vibrations; Error latency; intermittent fault detection; irredundant circuit; maximum likelihood estimator; random testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1980.1675595
