Title :
Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS
Author :
Kim, Hyung-Ock ; Lee, Bong Hyun ; Kim, Jong-Tae ; Choi, Jung Yun ; Choi, Kyu-Myung ; Shin, Youngsoo
Author_Institution :
Samsung Electron., Yongin, South Korea
fDate :
3/1/2010 12:00:00 AM
Abstract :
Power-gating has been widely used to reduce subthreshold leakage current. However, the extent of leakage saving through power-gating diminishes with technology scaling due to gate leakage of data-retention circuit elements. Furthermore, power-gating involves substantial increase of area and wirelength. A circuit technique called supply switching with ground collapse (SSGC) has recently been proposed to overcome the limitation of power-gating. The circuit technique is successfully applied to the register file of ARM9 microprocessor in a 1.2 V, 65-nm CMOS process, and the measured result is reported for the first time. The leakage current is reduced by a factor of 960 on average of 83 dies at 25??C , and by a factor of 150 at 85??C. Compared to a register file implemented in conventional power-gating, leakage current is cut by a factor of 2.2, demonstrating that SSGC can be a substitute for power-gating in nanometer CMOS.
Keywords :
CMOS integrated circuits; leakage currents; microprocessor chips; ARM9 microprocessor; CMOS; data-retention circuit element; ground collapse; low-leakage register files; power-gating; size 65 nm; subthreshold leakage current; supply switching; temperature 25 C; temperature 85 C; voltage 1.2 V; Leakage; low-power; power gating; register file; standard cell;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2009.2012429