DocumentCode :
1142309
Title :
Identification of Delay Measurable PDFs Using Linear Dependency Relationships
Author :
Flanigan, Edward ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
Volume :
18
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1011
Lastpage :
1015
Abstract :
Recently several methods have been presented to measure the delay of a small set of path delay faults (PDFs), known as a basis set which is used to compute the delays of PDFs. All methods assume that the basis consists of strong robustly tested PDFs because their delays can be measured. This paper presents procedures to identify measurable PDFs whose delays otherwise could not be measured by traditional strong robust sensitization. Path measurement techniques that conditer the bounded delay model allow us to compute the delays of almost all PDFs in existing benchmarks.
Keywords :
delays; fault diagnosis; integrated circuit design; delay measurable PDF; linear dependency relationships; path delay faults; path measurement technique; Bounded delay; path delay faults (PDF); strong robust;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2009.2017541
Filename :
5169838
Link To Document :
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