Title :
Identification of Delay Measurable PDFs Using Linear Dependency Relationships
Author :
Flanigan, Edward ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
fDate :
6/1/2010 12:00:00 AM
Abstract :
Recently several methods have been presented to measure the delay of a small set of path delay faults (PDFs), known as a basis set which is used to compute the delays of PDFs. All methods assume that the basis consists of strong robustly tested PDFs because their delays can be measured. This paper presents procedures to identify measurable PDFs whose delays otherwise could not be measured by traditional strong robust sensitization. Path measurement techniques that conditer the bounded delay model allow us to compute the delays of almost all PDFs in existing benchmarks.
Keywords :
delays; fault diagnosis; integrated circuit design; delay measurable PDF; linear dependency relationships; path delay faults; path measurement technique; Bounded delay; path delay faults (PDF); strong robust;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2009.2017541