• DocumentCode
    1142372
  • Title

    Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor

  • Author

    Crouzet, Y. ; Landrault, C.

  • Author_Institution
    Laboratoire d´´Automatique et d´´Analyse des Systemes du CNRS
  • Issue
    6
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    532
  • Lastpage
    537
  • Abstract
    Self-checking approaches developed so far deal with a gate level representation of logical circuits. They do not account for constraints which may result from an implementation by integrated circuits. This paper is concerned with such practical problems and their respective significance.
  • Keywords
    Coding; fault detection; self-checking; self-checking LSI circuits; Circuit faults; Costs; Digital integrated circuits; Digital systems; Electrical fault detection; Fault detection; Integrated circuit interconnections; Large scale integration; Logic; Microprocessors; Coding; fault detection; self-checking; self-checking LSI circuits;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675615
  • Filename
    1675615