DocumentCode
1142373
Title
DFT Expert: designing testable VLSI circuits
Author
Bhawmik, Sudipta ; Palchaudhuri, P.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
Volume
6
Issue
5
fYear
1989
Firstpage
8
Lastpage
19
Abstract
A set of expert-system modules for designing easily testable VLSI circuits called DFT Expert is described. DFT Expert operates at the register-transfer level of circuit description, classifying circuit components into data transporters (DTs) and data processors (DPs). It identifies DPs and DTs, selects a test method, configures global design for test (DFT), and generates test schedules. DFT Expert´s ability to test a practical circuit is demonstrated.<>
Keywords
VLSI; electronic engineering computing; expert systems; integrated circuit testing; DFT Expert; circuit description; data processors; data transporters; design for testability; designing testable VLSI circuits; register-transfer level; test schedules; Automatic testing; Circuit testing; Design for testability; Expert systems; Logic testing; Programmable logic arrays; Registers; Research and development; System testing; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.43075
Filename
43075
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