Title :
Diffractographic dimensional measurement
Author :
Pryor, T. ; Hageniers, O. ; North, W.
Author_Institution :
University of Windsor, Windsor, Ont., Canada
fDate :
6/1/1971 12:00:00 AM
Keywords :
Apertures; Detectors; Diffraction; Instruments; Laser beams; Optical refraction; Power engineering and energy; Rough surfaces; Surface roughness; Testing;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1971.1076738
