• DocumentCode
    1142568
  • Title

    Polarization imaging: principles and integrated polarimeters

  • Author

    Andreou, Andreas G. ; Kalayjian, Zaven Kevork

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD, USA
  • Volume
    2
  • Issue
    6
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    566
  • Lastpage
    576
  • Abstract
    Polarization is a general descriptor of light and contains information about reflecting objects that traditional intensity-based sensors ignore. Difficult computer vision tasks such as image segmentation and object orientation are made tractable with polarization vision techniques. Specularities, occluding contours, and material properties can be readily extracted if the Stokes polarization parameters are available. Astrophysicists employ polarization information to measure the spatial distribution of magnetic fields on the surface of the Sun. In the medical field, analysis of the polarization allows the diagnose of disease in the eyes. The retinae of most insect and certain vertebrate species are sensitive to polarization in their environment, but humans are blind to this property of light. Biologists use polarimeters to investigate behaviors of animals-vis-a-vis polarization-in their natural habitats. In this paper, we first present the basics of polarization sensing and then discuss integrated polarization imaging sensors developed in our laboratory.
  • Keywords
    CMOS image sensors; light polarisation; optical images; polarimeters; CMOS fabrication process; CMOS imager; Stokes polarization parameters; integrated polarimeters; integrated polarization imaging sensors; polarization sensing; polarization vision techniques; Computer vision; Data mining; Extraterrestrial measurements; Image segmentation; Magnetic field measurement; Magnetic sensors; Material properties; Optical polarization; Sensor phenomena and characterization; Sun;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2003.807946
  • Filename
    1178170